We can't find the internet
Attempting to reconnect
Something went wrong
Hang in there while we get back on track
£125.00
Elsevier Proceedings of the 11th European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis
Price data last checked 17 day(s) ago - will refresh soon
We'll watch every seller, every day. One email when your price arrives.
It has never been this cheap. We have no record of a lower price.
£125 today · cheaper than every other day in the last 3 months
NEW HERE?
Amazon shows you one price. We show you all of them.
Tosheroon watches Amazon prices so you don't have to. Every product on Amazon has a price history — we make it visible. Set the price you'd actually pay, and we'll email you the second it gets there. No app, no account, one email.
WHAT'S ON THIS PAGE
when this has been cheap or pricey
where the price is heading next
all-time high & low, recent range
name your number, we'll email you
Price History & Forecast
Grey patches = out of stock. Cheaper = lower on the chart. Hover for exact prices.
Last 74 days · 74 data points (no recent data)
Price Distribution
Price distribution over 74 days • 1 price levels
Price Analysis
Most common price: £125 (74 days, 100.0%)
Price range: £125 - £125
Price levels: 1 different prices over 74 days
Description
Product Specifications
- Brand
- Elsevier
- Format
- printed_access_code
- ASIN
- 0080439144
- Domain
- Amazon UK
- Release Date
- 21 November 2000
- Listed Since
- 04 April 2008
Barcode
No barcode data available
Similar Products You Might Like
Phase Change Memory: Device Physics, Reliability and Applications
Springer
Physics and Technology of Nuclear Materials
Reliability and Yield in Nanoelectronics Manufacturing
Springer
International Symposium on Photoelectronic Detection and Imaging 2011: Advances in Imaging Detectors and Applications
Theory of Microwave Valves: International Series of Monographs on Electronics and Instrumentation
Electronic Materials Innovations and Reliability in Advanced Memory Packaging (Springer Series in Reliability Engineering)
Springer
Mechanics of Composite Materials: Recent Advances
Fluid Dynamics Transactions
Fundamentals of Electromigration-Aware Integrated Circuit Design
Springer
The Physics Behind Semiconductor Technology
Springer
Advances in Imaging and Electron Physics: Volume 111
Academic Press
Weakest Bound Electron Theory and Applications
Springer
Light-emitting Diodes: Research, Manufacturing, and Applications XI (Proceedings of SPIE)
Road Vehicle Automation 11 (Lecture Notes in Mobility)
Springer
Piezotronics and Piezo-Phototronics: Applications to Third-Generation Semiconductors (Microtechnology and MEMS)
Springer
Luminescence Spectroscopy and Microscopy: Methods and Applications
Springer
Bibliography on the Fatigue of Materials, Components and Structures: 1961 - 1965
Physics of Geomagnetic Phenomena: International Geophysics Series, Vol. 11-1
Academic Press
Color Imaging XI: Processing, Hardcopy, and Applications (Proceedings of SPIE)
Aviation Materials and Electronic Systems: Theory and Practice
Springer
Semiconductor Power Devices: Volume 2: Packaging, Thermal aspects, Reliability and Ruggedness
Springer
Fundamentals of Radiation Physics for Medical Diagnostics
Springer
Plasmonic Instabilities in Bidimensional Materials (Springer Theses)
Springer
Physical Fundamentals of Oscillations: Frequency Analysis of Periodic Motion Stability
Springer